Voltage regulator with jitter control

ABSTRACT

A voltage regulator package includes a voltage regulator module that outputs a voltage signal of a particular voltage level through an output terminal is provided. The voltage regulator module may be switched on according to a periodic signal having a periodic signal frequency as a variable. The periodic signal frequency may be tuned to reduce impedance, jitter, or noise.

BACKGROUND

This disclosure relates to jitter-controlled voltage regulation for anintegrated circuit device.

This section is intended to introduce the reader to various aspects ofart that may be related to various aspects of these techniques, whichare described and/or claimed below. This discussion is believed to behelpful in providing the reader with background information tofacilitate a better understanding of the various aspects of thisdisclosure. Accordingly, it should be understood that these statementsare to be read in this light, and not as admissions of prior art.

Signal crosstalk phenomena may occur when a signal that is beingtransmitted through a circuit/signal channel of a circuit systemgenerates an undesired effect on another circuit/signal channel withinthe circuit system. Signal crosstalk may be the result of undesiredcapacitive, inductive, or conductive couplings between the two circuits.The undesired effects that could be caused by the signal crosstalkphenomenon may include signal jitter and signal noise.

A decoupling capacitor is designed as part of a circuit systemspecifically to reduce the undesired effects arising from the signalcrosstalk phenomenon. The decoupling capacitor may electrically decoupleone circuit from another circuit and thereby reducing the undesiredeffects arising from the signal crosstalk. The decoupling capacitor hasbecome an increasingly more influential component as many circuitsystems operate at increasingly lower voltage levels.

Generally, a circuit system that operates at lower voltage levels may bemore susceptible to the signal crosstalk phenomenon. Significant noiseand/or jitter levels caused from the signal crosstalk phenomenon onthese low voltage levels circuit systems may lead to undesiredalteration of information carried by the signals of the circuit system.However, it is difficult to design a decoupling capacitor for aswitching voltage regulator. The difficulty arises because a decouplingcapacitor designer may have to consider multiple design factors, forexample: a total impedance value, an inductance value, a capacitancevalue and also a switching frequency value of the voltage regulator.Furthermore, packaging trends that are leading towards integrating aswitching voltage regulator and an integrated circuit die in a singlepackage structure may also increase the difficulty of finding a properplacement for the decoupling capacitor within such a single packagestructure.

SUMMARY

Embodiments described herein include a voltage regulator package with ajitter control mechanism and a method of operating the jitter controlmechanism. It should be appreciated that the embodiments can beimplemented in numerous ways, such as a process, an apparatus, a system,a device, or a method. Several embodiments are described below.

In one embodiment, a voltage regulator package includes a voltageregulator module and a trim circuit. The voltage regulator moduleoutputs a voltage signal of a particular voltage level through an outputterminal. The voltage regulator module is switched on according to aperiodic signal function having a periodic signal frequency as avariable. In one embodiment, an oscillator circuit that is coupled tothe voltage regulator module may generate a periodic signal that isbased on the periodic signal function and transmit the period signal tothe voltage regulator module. The trim circuit may be programmable tochange the periodic signal frequency of the periodic signal function. Inone embodiment, the trim circuit may include multiple fuse elements.Different combinations of the fuse elements may correspond to differentperiodic signal frequency values.

In another embodiment, an integrated circuit package includes a packagesubstrate, an integrated circuit die and a voltage regulator device. Theintegrated circuit die and the voltage regulator device are formed onthe package substrate. The voltage regulator device may output a voltagesignal for the integrated circuit die through an output terminal of thevoltage regulator device. The voltage regulator device is a switchingvoltage regulator device that is controlled in accordance to a periodicsignal function having a periodic signal frequency as a parameter. Theperiodic signal frequency may be tunable.

In another embodiment, a method of calibrating a voltage regulatordevice that is coupled to an integrated circuit die using a testapparatus includes determining a switching voltage regulator frequencyvalue of the voltage regulator device that provides a lowest jittervalue on an input/output (I/O) terminal of the integrated circuit die.The method also includes adjusting activation of the voltage regulatordevice based on the switching voltage regulator frequency value.

Further features of the disclosure, its nature and various advantageswill be more apparent from the accompanying drawings and the followingdetailed description of the preferred embodiments.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows an illustrative integrated circuit package in accordancewith one embodiment of the present disclosure.

FIG. 2 shows an illustrative integrated voltage regulator (IVR) inaccordance with one embodiment of the present disclosure.

FIG. 3 shows an illustrative test setup to calibrate jitter controlmechanism of an integrated voltage regulator for an integrated circuitdie in accordance with one embodiment of the present disclosure.

FIG. 4 shows an illustrative integrated circuit package in accordancewith one embodiment of the present disclosure.

FIG. 5 shows a flowchart of an illustrative method for controllingjitter within an integrated circuit package using a test apparatus inaccordance with one embodiment of the present disclosure.

FIG. 6 shows two illustrative curves that show behavior of impedancevalues against different frequency values in accordance with oneembodiment of the present disclosure.

DETAILED DESCRIPTION

The following embodiments may include a voltage regulator package with ajitter control mechanism and a method to operate the jitter controlmechanism. It will be apparent, to one skilled in the art, that thepresent embodiments may be practiced without some or all of thesespecific details. In other instances, well-known operations have notbeen described in detail in order not to unnecessarily obscure thepresent embodiments.

Throughout this specification, when an element is referred to as being“connected” or “coupled” to another element, it may be directlyconnected or coupled to the other element or electrically connected orcoupled to the other element with yet another element interposed betweenthem.

FIG. 1, meant to be illustrative and not limiting, illustrates anintegrated circuit package in accordance with one embodiment of thepresent disclosure. Integrated circuit package 100 includes integratedcircuit (IC) die 110, integrated voltage regulator (IVR) 120, inductors130 and 150 and package substrate 160.

Integrated circuit package 100 may form a part of a wireless system, awired system, or other types of systems. Hence, integrated circuitpackage 100 may include circuits that perform various functions thatdefine the system. In one embodiment, integrated circuit package 100 maybe an application specific integrated circuit (ASIC) device or anapplication specific standard product (ASSP) device. Additionally oralternatively, integrated circuit package 100 may be a programmablelogic device (PLD), for example, a field programmable gate array (FPGA)device. It should be appreciated that a PLD may be configured toimplement different user designs or applications. In one embodiment, thePLD may be configured as a memory controller. In another embodiment, thePLD may be configured as an arithmetic logic unit (ALU).

Integrated circuit package 100 may be placed on a printed circuit board(PCB) (not shown). Solder balls 161, which are located at a bottom layerof package substrate 160, may be coupled to their respective solder pads(not shown) on the PCB. Hence, integrated circuit package 100 may alsobe referred to as a ball grid array (BGA) package in some instances. Inone embodiment, integrated circuit package 100 may transmit signals(e.g., input/output (I/O) signals) to a device mounted on the PCBthrough signal interconnections that are coupled to solder balls 161.

In some instances, integrated circuit package 100 may also be referredto as a system-in-package (SiP). The SiP is a package that includes anumber of integrated circuits enclosed/housed in a single package. TheSiP is designed to perform many of the functions of an electronic systemwhile packaged as a single package. As shown in the embodiment of FIG.1, integrated circuit package 100 may be a SiP that includes twodifferent integrated circuits (i.e., integrated circuit die 110 andintegrated voltage regulator 120) in one package.

Referring still to FIG. 1, integrated circuit package 100 includesintegrated circuit die 110. Integrated circuit die 110 may be placed ona top surface of package substrate 160. As shown in the embodiment ofFIG. 1, integrated circuit die 110 may be coupled to package substrate160 through flip-chip interconnections 111. In one embodiment, flip-chipinterconnections 111 may be controlled collapsed chip connections (C4)bumps. Pitch distances between flip-chip interconnections 111 may bemore than 1 millimeter (mm).

Integrated circuit die 110 may perform core functions of integratedcircuit package 100. In one embodiment, integrated circuit die 110 mayinclude active circuits (e.g., transistor circuits). The active circuitswithin integrated circuit die 110 may include memory elements,programmable logic elements or arithmetic logic units that perform avariety of functions. In one embodiment, integrated circuit die 110 isan FPGA die when integrated circuit package 100 is an FPGA device.

Additionally, integrated circuit die 110 may include input/output (I/O)circuits (not shown). The I/O circuits are utilized to transmit signalsout of integrated circuit die 110 or in to integrated circuit die 110.It should be appreciated that I/O circuits are designed according to aspecific signal protocol. In one embodiment, integrated circuit die 110may include I/O circuits for any chip interface protocol.

Integrated circuit package 100 also includes integrated voltageregulator 120. Integrated voltage regulator 120 may also be placed onthe top surface of package substrate 160. However, integrated voltageregulator 120 may be coupled to package substrate 160 through a surfacemounted technology (SMT) as shown in the embodiment of FIG. 1. However,it should be appreciated that a circuit designer generally has theoption to select from many types of packaging technology (e.g., aflip-chip package, wirebond package, and so forth) when designing aproduct. Each of these packaging technologies may have their advantagesand disadvantages. For example, the flip-chip packaging technology ispreferred over other types of packaging technology when the designerconsiders small pitch distances as one of its most essential designingcriteria. Additionally or alternatively, other packaging technologies(e.g., wirebond) may be preferred over other types of packagingtechnologies when the designer considers cost as one of its mostessential designing criteria.

Referring back to FIG. 1, integrated voltage regulator 120 generates avoltage signal. In one embodiment, integrated voltage regulator 120 maybe a switching voltage regulator. The switching voltage regulator may beswitched on/off (i.e., activated/deactivated) in accordance with aperiodic signal function to generate the voltage signal. Therefore, thevoltage signal that may be generated by the switching voltage regulatorcorresponds to a function of continuous switching on/off.

In one embodiment, the periodic signal function may have periodic signalfrequency as one of its parameter. In one embodiment, the integratedvoltage regulator 120 may be switched on/off based on a duty cycle of aperiodic signal. For example, integrated voltage regulator 120 isswitched on when the periodic signal is at positive voltage levels, andintegrated voltage regulator 120 is switched off when the periodicsignal is zero (or negative) voltage levels. In one embodiment,integrated voltage regulator 120 may be a buck converter, a boostconverter or a buck-boost converter.

The switching on/off of integrated voltage regulator 120 may alsogenerate a voltage signal that is similar to a square wave function. Forexample, when integrated voltage regulator 120 is switched on, thevoltage signal may be at a particular voltage level (e.g., 3.3 volts(V)). However, when integrated voltage regulator 120 is switched off,the voltage signal may be at zero voltage level (e.g., 0 V).

An electrical current may be transmitted through an output terminal ofintegrated voltage regulator 120 as a result of the voltage signal. Inone embodiment, when integrated voltage regulator 120 is switched on andhence the voltage signal is at the particular voltage level, theelectrical current is at a particular current level (e.g., greater than1 Ampere (A)). However, when integrated voltage regulator 120 isswitched off and hence the voltage signal is at the zero voltage level,the electrical current decreases in its current level. As a result ofthis, integrated circuit die 110 that is coupled to the output terminalof integrated voltage regulator 120 may receive an average electricalcurrent (e.g., 1 A) that is generated as result of constant switching ofintegrated voltage regulator 120.

Integrated voltage regulator 120 may include at least one decouplingcapacitor. The decoupling capacitor may be formed within integratedvoltage regulator 120. The decoupling capacitor may be coupled in ashunt manner to an interconnection that transmits an electrical currentout from integrated voltage regulator 120. As stated in the background,the decoupling capacitor may be utilized to decouple one part of anelectrical circuit from another part of the electrical circuit. In theembodiment of FIG. 1, the decoupling capacitor formed within theintegrated voltage regulator 120 may be utilized to decouple integratedvoltage regulator 120 from integrated circuit die 110. Furthermore, thedecoupling capacitor may also be utilized to reduce voltage ripples onthe voltage signal.

Additionally, decoupling capacitor 140 may be placed on packagesubstrate 160. Decoupling capacitor 140 is placed external to integratedvoltage regulator 120 as shown in the embodiment of FIG. 1. Similar tothe decoupling capacitor that is in integrated voltage regulator 120,decoupling capacitor 140 may also be coupled in a shunt manner to theinterconnection that transmits the electrical current out fromintegrated voltage regulator 120. Hence, decoupling capacitor 140 mayalso help to electrically decouple integrated voltage regulator 120 fromintegrated circuit die 110. Furthermore, decoupling capacitor 140 mayalso help to smoother rising and falling transients of the electricalcurrent.

The decoupling capacitors may help integrated circuit die 110 totransmit signals using any suitable 10 transmission protocol. It shouldbe appreciated that any noise as a result of a signal crosstalkphenomenon may affect quality of a signal, especially in terms of itsjitter when transmitting using the IO Interface protocol.

Integrated circuit die 110 may be coupled with integrated voltageregulator 120 through, for example, one or more package traces (notshown) formed on or within package substrate 160. In one embodiment,package substrate 160 may be a multi-layered package substrate. Thepackage traces may also be referred to as wire interconnections betweenintegrated circuit die 110 and integrated voltage regulator 120. Inaddition to that, the wire interconnections may also be coupled toinductors 130 and 150 and/or decoupling capacitor 140. In the embodimentof FIG. 1, inductors 130 and 150 may be coupled in series to the wireinterconnection.

FIG. 2, meant to be illustrative and not limiting, illustrates anintegrated voltage regulator (IVR) in accordance with one embodiment ofthe present disclosure. Integrated voltage regulator 220 may be similarto integrated voltage regulator 120 of FIG. 1. As shown in theembodiment of FIG. 2, integrated voltage regulator 220 includes voltageregulator module 221, oscillator circuit 222, trim circuit 223 anddecoupling capacitors 224.

Integrated voltage regulator 220 generates an electrical current thatmay be transmitted out of integrated voltage regulator 220 through wireinterconnection 225. Wire interconnection 225 may connect integratedvoltage regulator 220 to an integrated circuit die (e.g., integratedcircuit die 110 of FIG. 1). Additionally, wire interconnection 225 mayalso be coupled to inductors (e.g., inductors 130 and 150 of FIG. 1).

Voltage regulator module 221, within integrated voltage regulator 220,may generate a voltage signal at a particular voltage level. In oneembodiment, voltage regulator module 221 may be a switching voltageregulator module. embodiments of the switching voltage regulator modulemay include a buck converter, a boost converter and a buck-boostconverter.

Referring still to FIG. 2, voltage regulator module 221 may be switchingon/off (being activated or being deactivated) based on a periodic signalfunction. The periodic signal function may have a periodic signalfrequency as one of its variable parameter. In one embodiment, theperiodic signal function may be similar to a sine wave or a square wave.

In one embodiment, the electrical current that is output from voltageregulator module 221 may be at approximately 1 A with a peak voltagelevel of 3.3 V for the voltage signal. Furthermore, voltage ripples of avoltage signal output from voltage regulator module 221 may be less than10 millivolt (mV) peak-to-peak (peak-to-peak). It should be appreciatedthat the peak-to-peak voltage is defined as a voltage difference betweena maximum positive amplitude of the output signal and a maximum negativeamplitude of the output voltage signal when voltage regulator module 221is switched on.

Referring still to FIG. 2, oscillator circuit 222 may generate theperiodic signal that is supplied to voltage regulator module 221. Theperiodic signal may be in accordance to the sine wave function or thesquare wave function. In one embodiment, oscillator circuit 222 may be alinear/harmonic oscillator.

As stated in the embodiment of FIG. 1, the periodic signal may beutilized to control the activation /deactivation of voltage regulatormodule 221. In one embodiment, when the periodic signal is being basedon a sine wave function, voltage regulator module 221 may be in aswitched-on mode when the sine wave function is having positive voltagelevels, and is a switched-off mode when the sine wave function is havingnegative voltage levels. In another embodiment, when the periodic signalis being based on a square wave function, voltage regulator module 221may be in a switched-on mode when the square wave function is havingpositive voltage levels, and is a switched-off mode when the square wavefunction is having negative voltage levels.

As the switching on/off (i.e., activation and deactivation) of voltageregulator module 221 is controlled by a frequency value of the periodicsignal function, the frequency value of the periodic signal may also bereferred to as a switching frequency (Fsw).

Referring still to FIG. 2, voltage regulator module 221 may also includetrim circuit 223. Trim circuit 223 may be utilized to change theperiodic signal frequency variable within the periodic signal functionthat controls voltage regulator module 221 (i.e., changing the switchingfrequency of the switching voltage regulator). In one embodiment, theperiodic signal frequency variable is changed in order to obtain arelatively low output impedance at wire interconnection 225. The loweroutput impedance may help to reduce the voltage ripples on the voltagesignal and may also help to reduce jitters on signals (digital/analogsignals) in other circuits (e.g., comparators, signal processors, andthe like.). In one embodiment, the voltage ripples on the voltage signalmay be less than 10 mV peak-to-peak.

Trim circuit 223 may include a fuse circuit. Additionally oralternatively, trim circuit 223 may include an antifuse circuit. In oneembodiment, fuse or antifuse circuit may include multiple fuse orantifuse elements, respectively. Different combinations of these fuse orantifuse elements may correspond to different adjustments to theswitching frequencies of voltage regulator module 221. For example, acombination of fuse or antifuse elements may increase the switchingfrequency of the voltage regulator module 221 from its current value.Further, another combination of the fuse or antifuse elements maydecrease the switching frequency of voltage regulator module 221 fromits current value. The fuse elements within the fuse circuit generallyinclude low resistive structures, which may break and form highresistance paths when applied high voltage. In contrast, the antifuseelements within antifuse circuits may generally include high resistivestructures, which may break and form electrically conductive paths whena high current is applied.

Decoupling capacitors 224 may be coupled in a shunt manner to wireinterconnection 225. As stated in FIG. 1, decoupling capacitors 224 maybe utilized to decouple any noise generated by voltage regulator module221 to interfere with any external circuits (e.g., integrated circuitdie 110). As shown in the embodiment of FIG. 2, decoupling capacitor 224is formed together with voltage regulator module 221 within one package.It should be appreciated that decoupling capacitors 224 and voltageregulator module 221 are formed within a single package house (i.e.,within integrated voltage regulator 220) in order to increase the signaldecoupling effectiveness of decoupling capacitors 224. In oneembodiment, decoupling capacitors 224 may decrease voltage ripples by atleast additional 10 mV peak-to-peak when compared to externally placeddecoupling capacitors (e.g., on a printed circuit board next to avoltage regulator module).

The electrical current from integrated voltage regulator 220 may betransmitted out through wire interconnection 225. In one embodiment, thevoltage signal that is generated by integrated voltage regulator 220observes an output impedance value. The output impedance value dependson multiple factors. For example, the output impedance value may dependon inductance values of external inductors and capacitance values ofinternal and external decoupling capacitors. Furthermore, the outputimpedance value may also depend on the Fsw value of voltage regulatormodule 221.

In order to reduce jitter on signals at an external integrated circuit(e.g., integrated circuit die 110 of FIG. 1), voltage ripples of thevoltage signal generated by integrated voltage regulator 220 have to becontrolled. In one embodiment, the voltage ripples may be controlled byadjusting the switching frequency of voltage regulator module 221 sothat an output impedance value (that depends on inductances andcapacitances) is at a minimum value (Zmin). In one embodiment, signaljitter may be reduced by at least 50% when the switching frequency isadjusted to obtain a minimum output impedance value.

FIG. 3, meant to be illustrative and not limiting, illustrates a testsetup to calibrate a jitter control mechanism of an integrated voltageregulator for an integrated circuit die in accordance with oneembodiment of the present disclosure. Test setup 300 include integratedvoltage regulator (IVR) 320, integrated circuit die 310 and testapparatus 340. In one embodiment, integrated voltage regulator 320 maybe similar to integrated voltage regulator 120 of FIG. 1 or integratedvoltage regulator 220 of FIG. 2. Similarly, integrated circuit die 310may be similar to integrated circuit die 110 of FIG. 1. Hence, for thesake of brevity, the details of integrated voltage regulator 320 andintegrated circuit die 310 will not be repeated.

Integrated circuit die 310 may include I/O circuits 311 that are capableof transmitting signals. As described in the embodiment of FIG. 1, I/Ocircuits 311 may be utilized to transfer signals out of integratedcircuit die 110 or in to integrated circuit die 110. The transferring ofthe I/O signals may be based on a particular signal transmissionprotocol. In one embodiment, the I/O circuit 311 is transferring signalsusing any suitable IO transmission protocol, such as LVDS or the like.

Test apparatus 340 may be coupled to voltage regulator module 321through signal probe 342. Using signal probe 342, test apparatus 340 maycontrol the switching control frequency of voltage regulator module 321and may blow fuse elements formed in a trim circuit (e.g., trim circuit222 of FIG. 2). In one embodiment, test apparatus 340 through signalprobe 342 may direct voltage regulator module 321 to generate voltagesignals for a range of switching voltage regulator frequencies.

Test apparatus 340 may also be coupled to a wire interconnection thatcouples I/O circuit 311 of integrated circuit die 310 and integratedvoltage regulator 320 through probe 341. In the embodiment of FIG. 3,probe 341 may measure signal jitter for the I/O circuit 311. It shouldbe appreciated that the signal jitter may be measured by sampling thesignals transmitted through the I/O circuit 311. In one embodiment, testapparatus 340 may determine a switching voltage regulator frequency thatgenerates a relatively low jitter after test apparatus 340 uses voltageregulator module 321 to generate the voltage signals for the range ofswitching voltage regulator frequencies. Once the switching voltageregulator frequency having the lowest jitter is obtained, test apparatus340 may blow a combination of the fuse elements to fix integratedvoltage regulator 320 to that switching frequency.

FIG. 4, meant to be illustrative and not limiting, illustrates anequivalent circuit of integrated circuit package 100 of FIG. 1 inaccordance with one embodiment of the present disclosure. Circuit 400includes load 410, voltage supply 420, inductors 430 and 450, decouplingcapacitor 440, and equivalent series resistor (ESR) 460.

In an equivalent circuit, load 410 may represent integrated circuit die110 of FIG. 1 or integrated circuit die 310 of FIG. 3. Load 410 mayreceive an electrical current that is generated by power supply module420. In one embodiment, load 410 may represent an FPGA die.

Power supply module 420 may include voltage source 421 and decouplingcapacitor 424. Voltage source 421 may represent voltage regulator module221 of FIG. 2 or voltage regulator module 321 of FIG. 3. Voltage source421 may generate a voltage signal at a particular voltage level (e.g.,3.3 V). In one embodiment, voltage source 421 may represent a switchingvoltage regulator. Similarly, decoupling capacitor 424 may be similar todecoupling capacitor 224 of FIG. 2 or decoupling capacitor 324 of FIG.3. In one embodiment, decoupling capacitor 224 may have a capacitancevalue of 47 microfarad (μF).

Additionally, circuit 400 includes inductors 430 and 450 and ESR 460that is coupled in series between integrated circuit die 410 and voltageregulator module 421. ESR 460 represents resistive package traces on apackage substrate (e.g., package substrate 160 of FIG. 1). Circuit 400also include decoupling capacitor 440 that is coupled in a shunt mannerto an interconnection forming between integrated voltage regulator 420and integrated circuit die 410.

As shown in the embodiment of FIG. 4, voltage supply 421 may be coupledto decoupling capacitor 424 in a shunt manner. In on embodiment,decoupling capacitor 424 may be further represented by capacitor 424C,equivalent series inductance (ESL) 424B and equivalent series resistance(ESR) 424A.

In parallel to decoupling capacitor 424, decoupling capacitor 440 mayalso be coupled in shunt manner to load 410. Decoupling capacitor 440may have a portion of capacitance value of decoupling capacitor 424. Inone embodiment, decoupling capacitor 440 may have capacitance value of4.7 μF. Similar to decoupling capacitor 424, decoupling capacitor 440may also be further represented by capacitor 440C, equivalent seriesinductance 440B and equivalent series resistance 440A.

Based on this equivalent circuit 400, low jitter levels on signalstransmitted at/through load 410 may be possible when switching frequencyof voltage source 421 (i.e., voltage regulator module 221 of FIG. 2 orvoltage regulator module 321 of FIG. 3) is adjusted until decouplingcapacitor 440 has a relatively lower impedance value. In addition, thelow jitter levels on signals transmitted at/through load 410 may also bepossible when the capacitance value of decoupling capacitor 424 issignificantly larger than the capacitance value of decoupling capacitor440.

FIG. 5, meant to be illustrative and not limiting, illustrates aflowchart of a method for controlling jitter within an integratedcircuit package using a test apparatus in accordance with one embodimentof the present disclosure. In one embodiment, the integrated circuitpackage may be similar to integrated circuit package 100 of FIG. 1. Theintegrated circuit package includes an integrated circuit die (e.g.,integrated circuit die 110 of FIG. 2 or integrated circuit die 310 ofFIG. 3), an integrated voltage regulator (e.g., integrated circuitvoltage regulator 120 of FIG. 1, integrated circuit voltage regulator220 of FIG. 2 or integrated circuit voltage regulator 320 of FIG. 3) andat least one decoupling capacitor (decoupling capacitor 140 of FIG. 1).The test apparatus may be similar to test apparatus 340 of FIG. 3. Inone embodiment, the test apparatus may be coupled to the integratedcircuit device and the integrated voltage regulator using test probes(e.g., test probes 341 and 342).

At block 510, voltage signals for a range of switching voltage regulatorfrequencies are generated. The voltage signals are generated by theintegrated voltage regulator. In one embodiment, the voltage signals aregenerated by the integrated voltage regulator when the test apparatuscommands the integrated voltage regulator. The voltage signals aresupplied to the integrated circuit die through a wire interconnection(e.g., wire interconnection 225 of FIG. 2). It should be appreciatedthat the integrated voltage regulator may generate the output voltagesin a sweeping manner. For example, a first voltage signal is generatedwhen the integrated voltage regulator is switching at a first frequency;a second voltage signal is generated when the integrated voltageregulator is switching at a second frequency, and so on. In oneembodiment, the voltage signals are generated for switching frequenciesnear a roll-off frequency of the decoupling capacitor (e.g., between 1MHz to 10 MHz).

At block 520, jitter values for each of the switching voltage regulatorfrequency are measured. In one embodiment, the jitter values aremeasured from an I/O circuit (e.g., I/O circuit 311 of FIG. 3) of anintegrated circuit die (e.g., IC 310 of FIG. 3). The I/O circuit may betransmitting signals in accordance to the 10 transmission protocol. Themeasured jitters may be transmitted to the test apparatus through thetest probe. The test apparatus may store for the jitter values for eachassociated the switching voltage regulator frequencies.

At block 530, the test apparatus determines a switching voltageregulator frequency value that shows a relatively low jitter value. Inone embodiment, the relatively low jitter value may be observed when theswitching frequency of the integrated voltage regulator generates avoltage signal that may face relatively low impedance at the decouplingcapacitor. The switching frequency may be similar to the roll-offfrequency of the decoupling capacitor, in one embodiment.

At block 540, the switching frequency of the integrated voltageregulator is adjusted to a frequency value that generates the relativelylow jitter value. In one embodiment, the trimming may be performedthrough a trim circuit (e.g., trim circuit 223 of FIG. 2). The trimcircuit may include multiple fuse elements. In one embodiment, adjustingof the frequency value may be performed by blowing a combination of thefuse elements.

FIG. 6, meant to be illustrative and not limiting, illustrates twocurves that show behavior of impedance values against differentfrequency values in accordance with one embodiment of the presentdisclosure.

Curves V1 and V2 may be showing impedance values seen by voltage signalsgenerated by an integrated voltage regulator when passing throughdecoupling capacitors. In one embodiment, the integrated voltageregulator may be similar to integrated voltage regulator 220 of FIG. 2or integrated voltage regulator 320 of FIG. 3.

Further, the curve V1 may be impedance values seen the voltage signalswhen passing through an externally located decoupling capacitor to theintegrated voltage regulator (e.g., decoupling capacitor 140 of FIG. 1or decoupling capacitor 440 of FIG. 4). The curve V2 may be impedancevalues seen the voltage signals when passing through an internal locateddecoupling capacitor to the integrated voltage regulator (e.g.,decoupling capacitor 140 of FIG. 1 or decoupling capacitor 440 of FIG.4).

In one embodiment, the switching frequency is adjusted so that the CurveV2 may be having a relatively low impedance value (i.e., Zmin). Theswitching frequency may generate a voltage signal that has relativelylow voltage ripple (i.e., 10 mV peak-to-peak). As a result of that, theelectrical current transmitted to an integrated circuit die that iscoupled to the integrated voltage regulator may have relatively lowsignal jitters.

The term “substantially” or “approximately”, as may be used herein,provides an industry-accepted tolerance to its corresponding term. Suchan industry-accepted tolerance ranges from less than one percent totwenty percent depending on the particular implementation and design,and corresponds to, but is not limited to, component values, integratedcircuit process variations, temperature variations, rise and fall times,and/or thermal noise. As one may appreciate, the term “operablycoupled”, as may be used herein, includes direct coupling and indirectcoupling via another component, element, circuit, or module where, forindirect coupling, the intervening component, element, circuit, ormodule does not modify the information of a signal but may adjust itscurrent level, voltage level, and/or power level. Inferred coupling(i.e., where one element is coupled to another element by inference)includes direct and indirect coupling between two elements in the samemanner as “operably coupled”. The term “compares favorably”, as may beused herein, indicates that a comparison between two or more elements,items, signals, etc., provides a desired relationship. For example, whenthe desired relationship is that signal 1 has a greater magnitude thansignal 2, a favorable comparison may be achieved when the magnitude ofsignal 1 is greater than that of signal 2 or when the magnitude ofsignal 2 is less than that of signal 1.

The embodiments thus far have been described with respect to integratedcircuits. The methods and apparatuses described herein may beincorporated into any suitable circuit. For example, they may beincorporated into numerous types of devices such as programmable logicdevices, application specific standard products (ASSPs), and applicationspecific integrated circuits (ASICs). Examples of programmable logicdevices include programmable arrays logic (PALs), programmable logicarrays (PLAs), field programmable logic arrays (FPLAs), electricallyprogrammable logic devices (EPLDs), electrically erasable programmablelogic devices (EEPLDs), logic cell arrays (LCAs), complex programmablelogic devices (CPLDs), and field programmable gate arrays (FPGAs), justto name a few.

The programmable logic device described in one or more embodimentsherein may be part of a data processing system that includes one or moreof the following components: a processor; memory; IO circuitry; andperipheral devices. The data processing can be used in a wide variety ofapplications, such as computer networking, data networking,instrumentation, video processing, digital signal processing, or anysuitable other application where the advantage of using programmable orre-programmable logic is desirable. The programmable logic device can beused to perform a variety of different logic functions. For example, theprogrammable logic device can be configured as a processor or controllerthat works in cooperation with a system processor. The programmablelogic device may also be used as an arbiter for arbitrating access to ashared resource in the data processing system. In yet another example,the programmable logic device can be configured as an interface betweena processor and one of the other components in the system. In oneembodiment, the programmable logic device may be one of the families ofdevices owned by Altera Corporation or Intel Corporation.

Although the methods of operations were described in a specific order,it should be understood that other operations may be performed inbetween described operations, described operations may be adjusted sothat they occur at slightly different times or described operations maybe distributed in a system which allows occurrence of the processingoperations at various intervals associated with the processing, as longas the processing of the overlay operations are performed in a desiredway.

Although the foregoing disclosure has been described in some detail forthe purposes of clarity, it will be apparent that certain changes andmodifications can be practiced within the scope of the appended claims.Accordingly, the present embodiments are to be considered asillustrative and not restrictive, and the disclosure is not to belimited to the details given herein, but may be modified within thescope and equivalents of the appended claims.

What is claimed is:
 1. A voltage regulator package, comprising: avoltage regulator module that outputs a voltage signal of a particularvoltage level through an output terminal, wherein the voltage regulatormodule is switched on according to a periodic signal having a periodicsignal frequency as a variable; and a trim circuit that at least partlycontrols the periodic signal frequency of the periodic signal to reducean output impedance value on the output terminal.
 2. The voltageregulator package as defined in claim 1, wherein the trim circuit istrimmed to cause the periodic signal frequency to result in a relativelylowest output impedance value on the output terminal.
 3. The voltageregulator package as defined in claim 1, comprising: an oscillatorcircuit coupled to the voltage regulator module, wherein the oscillatorcircuit generates a periodic signal that is based at least in part onthe periodic signal.
 4. The voltage regulator package as defined inclaim 3, wherein the trim circuit is coupled directly to the oscillatorcircuit.
 5. The voltage regulator package as defined in claim 1, whereinthe trim circuit comprises fuse circuitry that comprises a plurality offuse elements, wherein different combinations of the fuse elementscorrespond to different frequency values of the periodic signal.
 6. Thevoltage regulator package as defined in claim 1, wherein the voltageregulator module comprises a switching voltage regulator module.
 7. Thevoltage regulator package as defined in claim 6, wherein the voltageregulator module comprises a boost converter circuit, a buck-boostconverter circuit or any combination thereof.
 8. The voltage regulatorpackage as defined in claim 1, comprising: at least one decouplingcapacitor that is coupled in a shunt manner to the output terminal ofthe voltage regulator module.
 9. The voltage regulator package asdefined in claim 8 is coupled to an external decoupling capacitor in ashunt manner to the output terminal of the voltage regulator module,wherein a capacitance value of the external decoupling capacitor is lessthan the a capacitance value of the at least one decoupling capacitor.10. An integrated circuit package, comprising: a package substrate; anintegrated circuit die formed on the package substrate; and a voltageregulator device formed on the package substrate, wherein the voltageregulator device outputs a voltage signal through an output terminal forthe integrated circuit die, wherein the voltage regulator device isactivated based at least in part on a periodic signal having a periodicsignal frequency as a parameter, and wherein the periodic signalfrequency is tunable to reduce an output impedance value on the outputterminal.
 11. The integrated circuit package as defined in claim 10,wherein the integrated circuit die is coupled to the voltage regulatordevice through a wire interconnection.
 12. The integrated circuitpackage as defined in claim 10, wherein a decoupling capacitor is formedon the package substrate and is coupled in parallel to the voltageregulator device and the integrated circuit die.
 13. The integratedcircuit package as defined in claim 10, wherein the integrated circuitdie comprises a field programmable gate array, an application specificintegrated circuit or an application specific standard product, or anycombination thereof.
 14. The integrated circuit package as defined inclaim 10, wherein the voltage regulator device comprises: an oscillatorcircuit that generates the periodic signal having the periodic signalfrequency.
 15. The integrated circuit package as defined in claim 14,wherein the voltage regulator device comprises: a trim circuit that isprogrammable to tune the periodic signal frequency.
 16. A method ofcalibrating a voltage regulator device that is coupled to an integratedcircuit die using a test apparatus, comprising: determining, using thetest apparatus, a switching frequency value of the voltage regulatordevice that provides a reduced signal jitter value on an input/output(I/O) terminal of the integrated circuit die; and adjusting, using thetest apparatus, a switching sequence of the voltage regulator devicebased at least in part on the switching frequency value to obtain theswitching frequency value of the voltage regulator device.
 17. Themethod as defined in claim 16, wherein the determining the switchingfrequency value for the voltage regulator device comprises: generating,using the test apparatus, voltage signals for a range of switchingfrequency values.
 18. The method as defined in claim 17, wherein thedetermining the switching frequency value of the voltage regulatordevice comprises: measuring, using the test apparatus, jitter values onthe I/O terminal for each of the voltage signals generated based on therange of the switching frequency values.
 19. The method as defined inclaim 18, wherein the determining the switching frequency values of thevoltage regulator device comprises: observing, using the test apparatus,voltage ripples on each of the voltage signals for the range of theswitching frequency values.
 20. The method as defined in claim 16,wherein the adjusting switching sequence of the voltage regulator devicebased on the switching frequency value comprises: blowing, using thetest apparatus, at least one of a plurality of fuses that corresponds tothe switching frequency value in a trim circuit of the voltage regulatordevice.